Please note: wafer level TXRF measurements are no longer available, details on TXRF Home Page.
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Please note: wafer level TXRF measurements are no longer available, details on TXRF Home Page.
|
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| Standing wave phenomena occur when the incident and reflected x-ray beams constructively interfere with each other. It is well known that when two traveling wave solutions are superposed upon each other a standing wave solution is generated, with twice the electric field vector. Since the intensity is proportional to the electric field2, any fluorescence x-rays emitted from the standing wave region can be increased by a factor of 4 (but this increase is usually less due to absorption effects).
from: R. Klockenkaemper et al. Analytical Chemistry 64, 1115 (1992). For our experimental setup, the standing waves enhance the fluorescence intensities seen by the detector and therefore lead to better detection limits. |
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