Electron Cloud: SEY Test, Project 1

A grooved profile surface reduces the effective SEY on the surface due to reduced escape probability of the secondary electrons. We measured the SEY of prototype rectangular grooved samples showing a very promising reduction of the SEY < 0.7. Prototype chambers with a grooved surface profile are under development for installation in the PEP-II LER. The prototype chambers are made in aluminum with the appropriate TiN coatings and diagnostic equipment. The actual groove chamber project has designed rectangular grooves with depth ~4mm.

Status: Completed extrusion chamber ready for installation in Nov. 2006.

 

Updated drawings package

Chamber drawings automatically updated:  V:\AD\PEP-II Upgrade\Projects\2004 AIP\ecloud\ (SLAC only)

 

V:\AD\PEP-II Upgrade\Projects\2004 AIP\ecloud\ (SLAC only)
  DRIFT CHAMBER ASSY   extr.par
      extr1mm.par
      extr1mm_r2.par
      extr1mm_r3.par
    extr2.dft extr2.par
      extr2mm.par

 

 

Meetings

 

Next Meeting scheduled for:  Wednesday 10:00 AM, October --, 2005, Alexander Room in Building 280, SLAC.

 

Tuesday, March 8 meeting:  M. Pivi "SEY full test in PEP-II updates".

Please request here the minutes of the 2004 Meetings.

 

Project costs

 

 

Acc. Design Responsible: M. Pivi, SLAC.
Collaboration: ILC Div. SLAC in collaboration with PEP-II.                                                                     

Layout chamber construction: T. Raubenheimer, J. Seeman, A. Kulikov, N. Kurita, A. Novokhatski, M. Pivi, T. Markiewicz.

Designers: D. Blankenship, N. Kurita.

Physics experiment: R. Kirby, M. Pivi, G. Collet, postdoc LC Div.

TiN Coating: Daniel Wright.

Chamber installation in PEP-II: K. Ratcliffe, T. Smith, K. Jobe, M. Ross, LC and PEP-II personnel.

 

 


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